ページ1に含まれる内容の要旨
FCC Class B Test Report
For A Class B Digital Device
Client:
SanDisk Corporation
7 Atir Yeda Street
Kfar Saba, Israel
Phone 972-9-7644908
Device Under Test:
SanDisk SSD SATA 5000 2.5”
Document Number: 2007160
Reference Number: QRTL07-033
This report may not be reproduced, except in full, without the written approval of Rhein Tech Laboratories, Inc.
ページ2に含まれる内容の要旨
Test Overview: Model No.: SanDisk SSD SATA 5000 2.5” Manufacturer’s SanDisk Corporation Name: Manufacturer’s 7 Atir Yeda Street Address: Kfar Saba, Israel Manufacturer’s Eitan Chalfon Contact: Type of Equipment: ITE Serial No.: 713050010 Year of Manufacture: 2007 Location of Testing: Rhein Tech Laboratories, Inc., Herndon, VA Date of Receipt: February 5, 2007 Date(s) of Testing: April 10, 2007 Purpose of Testing: FCC Class B Compliance Standard(s) to which devic
ページ3に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com TABLE OF CONTENTS 1 GENERAL INFORMATION ............................................................................................................................. 4 1.1 DEVIATIONS ................................................................................................................................................ 4 1.2 ACCREDITATION STATEMENTS ..................................................
ページ4に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 1 GENERAL INFORMATION The following test report for a Class B digital device is prepared on behalf of SanDisk Corporation in accordance with Part 2, and Part 15, Subparts A and B of the Federal Communications Commissions Rules and Regulations. The Equipment Under Test (EUT) was the SanDisk SSD SATA 5000 2.5”. The test results reported in this document relate only to the items that were tested. All me
ページ5に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 2 TEST DETAILS 2.1 PRODUCT DESCRIPTION SanDisk SATA 5000 2.5” SSD is a drop-in replacement for the hard disk drive. It has no moving/ mechanical parts. Features o 2.5" small form factor supporting unformatted capacity of 32GB o 9.5mm case height o SATA 7+15 pins combo connector Interface to host o Standards: SATA 1.0a 1.5Gb/s High performance o Host transfer rate: 150MB/s o Internal tran
ページ6に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 2.4 EQUIPMENT UNDER TEST Listed below are the identifiers and descriptions of all equipment, cables, and internal devices used with the EUT for this test. Equipment Under Test Part Manufacturer Model Serial FCC Cable RTL Equipment Number ID Description Bar Arrival Code Date SATA Storage SanDisk SanDisk SSD 713050010 DoC Internal N/A 4/10/2007 Device Corporation SATA 5000 2.5” Auxiliary Equipment
ページ7に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 2.5 CONFIGURATION OF TESTED SYSTEM Modem Laptop PC with USB Monitor Speaker Microphone SanDisk SSD Termination SATA 5000 SanDisk Corporation Page 7 of 17 DoC Report 2006137 04/27/07
ページ8に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 3 PRODUCT LABELLING/ INFORMATION TO THE USER 3.1 DOC LABEL ON DEVICE The label shall be located in a conspicuous location on the device and shall contain the unique identification described in FCC CFR 47; Section 2.1074 (the unique model name), and the following DoC logo: SanDisk Corporation SanDisk SSD SATA 5000 2.5” 3.2 DOC STATEMENT IN USER’S MANUAL For a Class B digital device o
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360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 4 CONDUCTED EMISSIONS 4.1 SITE AND TEST DESCRIPTION The power line conducted emission measurements were performed in a Series 81 type shielded enclosure manufactured by Rayproof. The EUT was assembled on a wooden table 80 centimeters high. Power was fed to the EUT through a 50 ohm /50 microhenry Line Impedance Stabilization Network (EUT LISN). The EUT LISN was fed power through an A.C. filter box on
ページ10に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 4.2 CONDUCTED EMISSIONS TEST DATA Mode: 115 vac, 60 Hz. Neutral Conductor Temperature: 75°F Humidity: 31% Emission Test Analyzer Site Emission CISPR B CISPR B CISPR B CISPR B Pass/ Frequency Detector Reading Correction Level QP QP AV AV Fail (MHz) (dBuV) Factor (dBuV) Limit Margin Limit Margin (dB) (dBuV) (dBuV) (dBuV) (dBuV) 0.157 Qp 56.2 0.2 56.4 65.6 -9.2 55.6 Pass 0.157 Av 33.4 0.2 33.6 65.6
ページ11に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 4.3 CONDUCTED TEST PHOTOGRAPHS SanDisk Corporation Page 11 of 17 DoC Report 2006137 04/27/07
ページ12に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 5 RADIATED EMISSIONS 5.1 SITE AND TEST DESCRIPTION Before final measurements of radiated emissions were made on the open-field three/ten meter range, the EUT was scanned indoor at one and three meter distances. This was done in order to determine its emissions spectrum signature. The physical arrangement of the test system and associated cabling was varied in order to determine the effect on the EU
ページ13に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 5.2 FIELD STRENGTH CALCULATION The field strength is calculated by adding the Antenna Factor and Cable Factor, and subtracting the Amplifier Gain (if any) from the measured reading. The basic equation with a sample calculation is as follows: FI(dBuV/m) = SAR(dBuV) + SCF(dB/m) FI = Field Intensity SAR = Spectrum Analyzer Reading SCF = Site Correction Factor The Site Correctio
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360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 5.3 RADIATED EMISSIONS TEST DATA Temperature: 48°F Humidity: 36% Emission Test Antenna Turntable Antenna Analyzer Site Emission Pass/ Frequency Detector Polarity Azimuth Height Reading Correction Level Limit Margin Fail (MHz) (H/V) (deg) (m) (dBuV) Factor (dBuV/m) (dBuV/m) (dB) (dB/m) 50.000 Qp H 200 3.0 38.4 -22.2 16.2 30.0 -13.8 Pass 73.800 Qp V 100 1.0 41.6 -23.5 18.1 30.0 -11.9 Pass 144.000
ページ15に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 5.4 RADIATED TEST PHOTOGRAPHS SanDisk Corporation Page 15 of 17 DoC Report 2006137 04/27/07
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360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 6 EMISSIONS EQUIPMENT LIST The following is a list of equipment Rhein Tech uses to perform testing. Part Type Manufacturer Model Serial Number Barcode Cal Due Date Conducted Emissions (SR2, SA3) Spectrum Analyzer (10kHz-1.5GHz) Hewlett Packard 8567A 2602A00160 900968 8/14/2007 Spectrum Analyzer Display Section Hewlett Packard 85662A 2542A11239 900970 8/14/2007 Quasi-Peak Adapter Hewlett Packard 85650A
ページ17に含まれる内容の要旨
360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com 7 MANUFACTURER’S EQUIPMENT FILE CHECKLIST (PER FCC RULES §2.1075) This checklist shall be used by the manufacturer to verify the correct filing per FCC 2.1075 Retention of records for products produced and marketed. PRODUCT MODEL(s): Records Verified By: SanDisk SSD SATA 5000 2.5” A record of the original design drawings and specifications. A record of all changes that have been made that woul
